Methods and Artifacts for Comparison of Scanning CMM Performance

[+] Author and Article Information
Sami A. Farooqui, Edward P. Morse

Center for Precision Metrology, Department of Mechanical Engineering and Engineering Science, The University of North Carolina at Charlotte, Charlotte, NC 28223

J. Comput. Inf. Sci. Eng 7(1), 72-80 (Jan 22, 2007) (9 pages) doi:10.1115/1.2709928 History: Received September 19, 2005; Revised January 22, 2007

Coordinate measuring machines (CMMs) with continuous-contact scanning capabilities are experiencing more and more use in a wide variety of discrete-part manufacturing industries. Many users of these CMMs, if asked, will say that their metrology requirements include high density scans at high speeds with high accuracy. These requirements are in conflict, as there will be some point at which the accuracy of the scanned data begins to decrease with an increase in the scanning speed. This paper addresses the effects of scanning speed on the performance of different CMMs using contact sensors. The use of a family of artifacts is proposed in order to evaluate the relative scanning performance as a function of scanning speed and the direction of the scan within the CMM volume. The artifacts that are developed for these tests have a sinusoidal waveform superimposed on a flat surface. This paper describes a series of experiments that utilize these artifacts and assess the ability of these tests to capture how a scanning CMM will perform when measuring actual parts.

Copyright © 2007 by American Society of Mechanical Engineers
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Figure 1

Target scan planes on the test sphere per ISO 10360-4

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Figure 2

Sinusoidal artifacts: linear (top), high-amplitude (left), and low-amplitude (right) artifacts

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Figure 3

Linear sinusoidal artifact

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Figure 4

Deviations from LS sine wave (data from Talysurf 120L with 1μm point density)

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Figure 5

Deviations from LS sine wave for different scanning speeds (data from CMM)

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Figure 6

Comparison of scans on low-amplitude sine disk scanned on two different CMMs

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Figure 7

Performance of two CMMs in measuring the low-amplitude sine disk

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Figure 8

Effect of speed while scanning the high-amplitude sine disk

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Figure 9

Comparison of scans on linear artifact scanned on CMM 3

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Figure 10

Scans in the x direction with 2mm∕s, 5mm∕s, 8mm∕s, 10mm∕s scanning speed compared to the reference scan

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Figure 11

Comparison of a 20mm∕s scan in x direction with the reference scan

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Figure 12

Scans in xy (with spike near middle) and xyz direction (with undulations) compared to the reference scan (scanning speed: 1mm∕s)

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Figure 13

Deviations from LS sine wave for 2mm∕s scan in xyz direction

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Figure 14

High-amplitude disk scanned on CMM 4, along different directions and at different speeds

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Figure 15

Simulated plot comparing different CMMs



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