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  • Proceedings Article January 01, 2007

    Zuozhi Zhao; Michelle Bezdecny; Byungwoo Lee; Yanyan Wu; Dean Robinson; Mark Slagle; Duke Coleman; John Barnes; Steve Walls; Lowell Bauer

    Proc. ASME. 48051; Volume 4: ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications and the 19th Reliability, Stress Analysis, and Failure Prevention Conference:891-900.January 01, 2007
    DETC2007-35688
    doi: 10.1115/DETC2007-35688