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TECHNICAL PAPERS

Automatic Assembly Feature Recognition and Disassembly Sequence Generation

[+] Author and Article Information
Raymond C. W. Sung, Jonathan R. Corney

Department of Mechanical and Chemical Engineering, Heriot-Watt University, Edinburgh, EH14 4AS, United Kingdom

Doug E. R. Clark

Department of Mathematics, Heriot-Watt University, Edinburgh, EH14 4AS, United Kingdome-mail: derc@ma.hw.ac.uk

J. Comput. Inf. Sci. Eng 1(4), 291-299 (Oct 01, 2001) (9 pages) doi:10.1115/1.1429931 History: Received August 01, 2001; Revised October 01, 2001
Copyright © 2001 by ASME
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References

Figures

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(a) B-rep model, (b) octree representation, (c) S-adjacent feature, d) C-adjacent features
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Disassembly sequences for test assembly 1
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Disassembly sequences for test assembly 2
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Disassembly sequences for test assembly 3
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High resolution octree representation of test assembly 3
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Examples of contact and spatial adjacency
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Possible traversal paths
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Octants found adjacent to the starting face (i.e. enclosing the cylinders)
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Adjacent octants with anti-parallel orientation to the search direction
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C-adjacent and S-adjacent faces on test model
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Disassembly sequence tree
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Internal and external S-adjacent faces
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Unobstructed projection of fi onto fj
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(a) octants, (b) octree structure, (c) linear octree
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VRML representation of octant list
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Two sections through the assembly model

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