Fitting Freeform Shape Patterns to Scanned 3D Objects

[+] Author and Article Information
Joris S. M. Vergeest, Sander Spanjaard, Imre Horváth, Jos J. O. Jelier

Delft University of Technology, Jaffalaan 9, NL-2628 BX Delft, The Netherlands

J. Comput. Inf. Sci. Eng 1(3), 218-224 (Sep 01, 2001) (7 pages) doi:10.1115/1.1419197 History: Received November 01, 2000; Revised September 01, 2001
Copyright © 2001 by ASME
Your Session has timed out. Please sign back in to continue.



Grahic Jump Location
The eight principle objects relevant in the shape reuse methodology. The dashed lines indicate mutual influence, the thin arrows indicate dependency, the bold arrows represent the main workflow of shape reuse.
Grahic Jump Location
Measuring the similarity of shape A to B, and of A to B
Grahic Jump Location
The feature parameters of the ridge include the parameters defining the shape of the path of the ridge
Grahic Jump Location
Physical part selected for 3D scanning. A region of interest, containing a ridge, is indicated.
Grahic Jump Location
Digitized points S from the physical part (top) and the subset of interest F⊂S (bottom)
Grahic Jump Location
An instance of the ridge pattern
Grahic Jump Location
Parameters (q) for the pattern G(q)
Grahic Jump Location
To prepare for the distance computation, points have been sampled from the ridge pattern (thick points); these are shown adjacent to the digitized sample F (thin points)
Grahic Jump Location
The directed Hausdorff distance e between the data sample and the template as a function of the z-coordinate of the template
Grahic Jump Location
The distance e as a function of the y-coordinate of the template
Grahic Jump Location
Distance e as a function of the width of the ridge
Grahic Jump Location
Distance e as a function of the height of the ridge




Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related Journal Articles
Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In