0
TECHNICAL PAPERS

Fitting Freeform Shape Patterns to Scanned 3D Objects

[+] Author and Article Information
Joris S. M. Vergeest, Sander Spanjaard, Imre Horváth, Jos J. O. Jelier

Delft University of Technology, Jaffalaan 9, NL-2628 BX Delft, The Netherlands

J. Comput. Inf. Sci. Eng 1(3), 218-224 (Sep 01, 2001) (7 pages) doi:10.1115/1.1419197 History: Received November 01, 2000; Revised September 01, 2001
Copyright © 2001 by ASME
Your Session has timed out. Please sign back in to continue.

References

Ingle, K. A., 1994, “Reverse Engineering,” McGraw-Hill, New York.
Noort, A., and Bronsvoort, W. F., 1999, “Automatic Model Adjustment in Form Feature Conversion,” Proc. DETC99/CIE-9120, ASME, New York.
Sinha, S. S., and Seneviratne, P., 1996, “Part to Art,” Proc. ASME Computers in Engineering Conf., 96-DETC/DFM-1293, ASME, New York, pp 1–7.
Au,  C. K., Yuen,  M. M. F., 2000, “A Semantic Feature Language for Sculptured Object Modelling,” Computer-Aided Design, 32, pp 63–74.
Mitchell,  S. R., Jones,  R., and Catchpole,  G., 2000, “Modelling a Thin Section Sculptured Product Using Extended from Feature Methods,” Adv. Met. Semicond. Clusters, 11, No. 4.
Cavendish,  J. C., 1995, “Integrating Feature Based Surface Design with Free Form Deformation,” Computer-Aided Design, 27, No. 9, pp. 703–711.
van Elsas,  P. A., and Vergeest,  J. S. M., 1998, “Displacement Feature Modelling for Conceptual Design,” Computer-Aided Design, 30, No. 1, pp. 19–27.
Fontana, M., Giannini, F., and Meirana, M., 1999, “A Free Form Feature Taxonomy,” P. Brunet and R. Scopigno (Eds.), Proc. Eurographics’99, Computer Graphics Forum, 18 , Nr. 3.
Poldermann, A., and Horváth, I., 1996, “Surface Design Based on Parametrized Surface features,” I. Horváth and Károly Vŕradi (Eds.), Proc. Int. Symposium on Tools and Methods for Concurrent Engineering, Institute of Machine Design, Budapest, pp. 432–446.
Gindy,  N. N. Z., 1989, “A Hierarchical Structure for From Feature,” J. Production Research, 27, pp. 2089–2103.
Eversheim, W., Deckert, C., Westekemper, M., 2000, “Increasing Efficiency through Integration of Freeform Features into the CAD/CAM-chain,” Proceedings of the 9th Symposium on Product Data Technology Europe 2000, Quality Marketing Services, Sandhurst, pp. 355–362.
Hsu,  W. M., Hughes,  J. F., Kaufman,  H., 1992, “Direct Manipulation of Free-form Deformations,” ACM Computer Graphics, 26, No. 2, pp. 177–184.
Duffy, A. H. B., and Ferns, A. F., 1999, “An Analysis of Design Reuse Benefits,” U. Lindemann et al. (Eds.), Proceedings of the ICED99 Conference, Technische Universität München, 1999, pp. 799–804.
Smyth, S. N., and Wallace, D. R., 2000, “Towards the Synthesis of Aesthetic Product form,” Proc. DETC2000/DTM-14554, ASME, New York.
De Martino,  T., Falcidieno,  B., Giannini,  F., Hassinger,  S., and Ovtcharova,  J., 1994, “Feature-based Modelling by Integrating Design and Recognition Approaches,” Computer-Aided Design, 26, No. 8, pp. 646–652.
Várady,  T., Martin,  R. R., and Cox,  J., 1997, “Reverse Engineering of Geometrical Models- An Introduction,” Computer-Aided Design, 29, No. 4, pp. 255–268.
Krishnamurthy, V., 1998, “Fitting Freeform Surfaces to Dense Polygon Meshes,” PhD dissertation, Stanford University.
Vergeest, J. S. M., Horváth, I., and Spanjaard, S., 2001, “A Methodology for Reusing Freeform Shape Content,” Proc. ASME 2001 Conf. on Design Theory and Methodology, ASME, New York, DETC’01/DTM21708.
Meiritz, (Ed.) 1999, “Conference on Reverse Engineering, 3D Scanning and a Shortcut to Modelling,” Danish Technological Institute, Aarhus.
Puntambekar,  N. V., Jablokow,  A. G., and Sommer,  H. J., 1994, “Unified review of 3D Model Generation for Reverse Engineering,” Computer Integrated Manufacturing Systems, 7, No. 4, pp 259–268.
Renner, G., Váradi, T., and Weiss, V., 1998, “Reverse Engineering of Freeform Features,” Proc. PROLAMAT 98, IFIP.
Hagedoorn,  M., and Veltkamp,  R. C., 1999, “Reliable and Efficient Pattern Matching Using an Affine Invariant Metric,” Int. J. Comput. Vis., 31, No. 2/3, pp. 203–225.
Thompson,  W. B., Owen,  J. C., de St. Germain,  H. James, Stark,  S. R., and Henderson,  T. C., 1999, “Feature-based Reverse Engineering of Mechanical Parts,” IEEE Trans. Rob. Autom., 15, No. 1, pp. 57–66.
Tangelder, J. W. H., Ermes, P., Vosselman, G., and van den Heuvel, F. A., 1999, “Measurement of Curved Objects Using Gradient Based Fitting and CSG Models,” International Workshop on Photogrammetric Measurement, Object Modeling and Documentation in Architecture and Industry, Thessaloniki, Greece, July 7–9, 1999. International Archives of Photogrammetry and Remote Sensing, Vol. 12, Part 5W11, pp. 23–30.
Alt,  H., Mehlhorn,  K., Wagener,  H., and Welz,  E., 1988, “Congruence, Similarity, and Symmetries of Geometric Objects,” Discrete Computational Geometry, 3, pp. 237–256.
Spanjaard, S., 2001, “Comparing Different Fitting Strategies for Matching Two 3D Point Sets Using a Multivariable Minimizer,” Proc. ASME 2001 Conf. on Design Theory and Methodology, ASME, New York, DETC’01/CIE21242.
Jansson, J., Horváth, I., and Vergeest, J. S. M., 2000, “Implementation and Analysis of a Mechanics Simulation Module for Use in Conceptual Design System,” Proc. ASME Computers in Engineering Conf., DETC2000/DAC-14489, ASME, New York.

Figures

Grahic Jump Location
The eight principle objects relevant in the shape reuse methodology. The dashed lines indicate mutual influence, the thin arrows indicate dependency, the bold arrows represent the main workflow of shape reuse.
Grahic Jump Location
Measuring the similarity of shape A to B, and of A to B
Grahic Jump Location
The feature parameters of the ridge include the parameters defining the shape of the path of the ridge
Grahic Jump Location
Physical part selected for 3D scanning. A region of interest, containing a ridge, is indicated.
Grahic Jump Location
Digitized points S from the physical part (top) and the subset of interest F⊂S (bottom)
Grahic Jump Location
An instance of the ridge pattern
Grahic Jump Location
Parameters (q) for the pattern G(q)
Grahic Jump Location
To prepare for the distance computation, points have been sampled from the ridge pattern (thick points); these are shown adjacent to the digitized sample F (thin points)
Grahic Jump Location
The directed Hausdorff distance e between the data sample and the template as a function of the z-coordinate of the template
Grahic Jump Location
The distance e as a function of the y-coordinate of the template
Grahic Jump Location
Distance e as a function of the width of the ridge
Grahic Jump Location
Distance e as a function of the height of the ridge

Tables

Errata

Discussions

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related Journal Articles
Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In